Relative intensity noise of a quantum well transistor laser

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Abstract

A quantum well transistor laser with a base cavity length L 300 μm has been designed, fabricated, and operated at threshold ITH 25 mA (0 °C). As a consequence of the inherent advantage of the picosecond base recombination lifetime, the transistor laser is able to achieve nearly a quantum shot-noise limited laser relative intensity noise (RIN) with a peak amplitude of -151 dB/Hz at frequency 8.6 GHz. Compared with a diode laser (a charge storage device) at the same output power, the transistor laser (a charge flow device) has a better than 28 dB (number dependent on the laser device design) peak RIN advantage. © 2012 American Institute of Physics.

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Tan, F., Bambery, R., Feng, M., & Holonyak, N. (2012). Relative intensity noise of a quantum well transistor laser. Applied Physics Letters, 101(15). https://doi.org/10.1063/1.4760225

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