'Pink -beam X-ray powder diffraction profile and its use in Rietveld refinement

Abstract

The powder diffraction profile obtained with a pink-beam synchrotron X-ray source is described as the convolution of a back-to-back pair of exponentials convoluted with the Gaussian and Lorentzian components of a pseudo-Voigt. This new function is employed for the first time in a Rietveld refinement using data collected from a single 100ps synchrotron X-ray micropulse.