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Phase Detection Using Low-Loss EELS with Aberration Corrected STEM

  • Schamp C
  • Casillas G
  • Jose-Yacaman M
Microscopy and Microanalysis (2011) 17(S2) 820-821
DOI: 10.1017/s1431927611004971
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Schamp, C., Casillas, G., & Jose-Yacaman, M. (2011). Phase Detection Using Low-Loss EELS with Aberration Corrected STEM. Microscopy and Microanalysis, 17(S2), 820–821. https://doi.org/10.1017/s1431927611004971

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