Characterization of GaN microstructures grown by plasma-assisted molecular beam epitaxy

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Abstract

The characterization of GaN microstructures grown by plasma-assisted molecular beam epitaxy on LiAlO2 substrate was studied by cathodoluminescence and photoluminescence measurements. We demonstrated that the cathodoluminescence from oblique semi-polar surfaces of mushroom-shaped GaN was much brighter than that from top polar surface due to the reduction of polarization field on the oblique semi-polar surfaces. It implies that the oblique semi-polar surface is superior for the light-emitting surface of wurtzite nano-devices. © 2013 Author(s).

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Lo, I., Pang, W. Y., Chen, W. Y., Hsu, Y. C., Hsieh, C. H., Shih, C. H., … Hsu, G. Z. L. (2013). Characterization of GaN microstructures grown by plasma-assisted molecular beam epitaxy. AIP Advances, 3(6). https://doi.org/10.1063/1.4812871

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