Investigation and characterization of iron powders for zero-valent iron (Fe 0 ) in synchrotron radiations

ISSN: 22498958
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Abstract

This study employs four differential synchrotron radiation techniques to characterize the composition of underlying Zero Valent Iron (ZVI) source in three readily commercially available iron particles (code name-M100, R12, and Scrap Iron) and highlights the importance of engaging multiple investigation methods in sourcing ZVI. With ZVI or Fe0 having reducing properties to convert harmful chemicals to harmless substances found, its widespread functional application in the environmental remediation purposes is on the rise. Consequently, attempts were being made in choosing iron powders as ZVI source in interdisciplinary researches for exploring catalytic chemical reactions of ZVI. XAS-XANES and XPS spectra revealed scrap iron could not be regarded as hopeful ZVI sources since its edges and occurrences were detected entirely in contrast against standard iron foil having noticeable valency zero, and rather resembling to iron oxides. M100 and R12 were found consisting more percentage of zero valence properties than iron foil. Homogeneity and phase identification were further investigated by mean of XRD, and discovered R12 and M100 were comparable to reference iron standards. In addition, µ-XRF uncovered possible cross contaminants existed in the samples. Finally, SEM analysis disclosed distinctive metallic morphology, formation and texture of selected iron particles. This study resolved the controversial assumption that all iron source consist of credible ZVI source for its catalytic reaction to take place. And contradictory iron oxides reactions could be highly possible on conditions when irons are not taken comparative characterization methods prior to source ZVI for requisite purpose.

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Pyae, H. A., Aye, W. W., & Yossapol, C. (2019). Investigation and characterization of iron powders for zero-valent iron (Fe 0 ) in synchrotron radiations. International Journal of Engineering and Advanced Technology, 8(3), 184–193.

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