Beyond Imaging: Atomic Force Microscopy as an Integrated Tool for Nanomechanical Probing and Active Manipulation of Low-Dimensional Materials

Abstract

1D and 2D nanomaterials serve as foundational components for next-generation functional devices, owing to their exceptional and often unique mechanical, optical, and electronic properties. However, the precise characterization of their nanomechanical behaviors and underlying mechanisms remains a significant challenge due to their nanoscale dimensions. Atomic force microscopy (AFM) has emerged as a powerful platform that bridges this gap, offering powerful capabilities for in situ manipulation and quantitative measurement of physical properties with piconewton force sensitivity and sub-nanometer spatial resolution. This review comprehensively summarizes the progress of AFM-based techniques for probing the nanomechanics of 1D and 2D materials. We provide a critical analysis of the application of these techniques in assessing fundamental mechanical properties (elastic modulus, strength, and adhesion), dynamic behaviors (friction, superlubricity, and fatigue), and enabling precise nanomanipulation (picking, placing, folding, and rotating). These AFM-based methods enable versatile mechanical characterizations across diverse scenarios, ranging from point measurements to planar analyses. By integrating these diverse modes, AFM facilitates a multifaceted understanding of the intrinsic structure, atomic-scale mechanisms, and function relationships in low-dimensional systems. This thorough overview aims to inspire the broader application of AFM in materials science, providing technical support for the rational design and development of advanced functional materials.