Abstract
Two recent models of Schottky barrier formation are discussed. These invoke ‘‘metal-induced gap states’’ or native defects to explain Fermi-level pinning. Available experimental data can be satisfactorily explained by states intrinsic to the surface and interface, without postulating a defect pinning mechanism. In contrast, recent theoretical and experimental work appears to contradict the proposed defect mechanism. The connection between Schottky barriers and semiconductor heterojunction band lineups is proposed as a possible test of theory.
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CITATION STYLE
Tersoff, J. (1985). Recent models of Schottky barrier formation. Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena, 3(4), 1157–1161. https://doi.org/10.1116/1.583031
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