NMR investigation of atomic ordering in AlxGa1-xAs thin films

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Abstract

Nuclear magnetic resonance is used to study the local cation ordering in thin films of AlxGa1-xAS (0 <0.5) grown by metal organic vapor phase epitaxy. A quantitative analysis of the 75As resonance intensities and the quadrupole coupling constants of all nuclei reveal that our data is compatible with the absence of significant ordering.

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Degen, C., Tomaselli, M., Meier, B. H., Voncken, M. M. A. J., & Kentgens, A. P. M. (2004). NMR investigation of atomic ordering in AlxGa1-xAs thin films. Physical Review B - Condensed Matter and Materials Physics, 69(19). https://doi.org/10.1103/PhysRevB.69.193303

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