Photoluminescence, photoacoustic and structural characteristics of polycrystalline Zn2Tio4: Ni2+semiconductor

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Abstract

This work presents the investigation, at room temperature, of Zn2TiO4samples containing Ni2+ions as substitutional impurities. Samples with molecular formula Zn2(1-x)Ni2xTiO4, where x = 0.00, 0.0007, 0.001, 0.0013, 0.002 and 0.003, in which Zn2+ions were replaced by Ni2+ions, were prepared through solid-state method, crystalline data were obtained by X-ray diffraction, the elemental composition was determined by X-ray fluorescence and the optical properties were investigated through photoluminescence and photoacoustic techniques. The photoluminescence spectra showed broadbands from 640 nm to 800 nm. The emission of the Zn2(1-x)Ni2xTiO4samples was assigned to the overlapping of the Ni2+and the Zn2TiO4emission. The most intense photoluminescence signal was obtained with excitation radiation at a wavelength of 360 nm for the sample with x = 0.001. The photoacoustic spectra showed absorption bands characteristic of semiconductor materials due to the host Zn2TiO4. The energy bandgap of the Zn2(1-x)Ni2xTiO4 was obtained from photoacoustic absorption spectra.

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Gomes, L. P. V., Pedro, S. S., López, A., Camara, A. R., Cella, N., & Sosman, L. P. (2020). Photoluminescence, photoacoustic and structural characteristics of polycrystalline Zn2Tio4: Ni2+semiconductor. Materials Research, 23(3). https://doi.org/10.1590/1980-5373-MR-2020-0061

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