Microstructure and dielectric properties of YMnO3 thin films prepared by dip-coating

Abstract

YMnO3 thin films with Y/Mn ratios from 1.00/1.05 to 1.00/ 0.90 were prepared by dip-coating from solution, in which starting materials were refluxed, and the effects of the Y/ Mn ratio on the structure and dielectric properties of YMnO3 thin films were investigated. XRD measurements indicated that the films with the Y/Mn ratios in this study were a single phase of polycrystalline YMnO3. The lattice constants along the a-axis and c-axis lengthened with an increase in the Y/Mn ratio. FE-SEM micrographs of the films showed that the surface of the films became smoother and denser with an increase in the Y/Mn ratio. YMnO3 thin films with good dielectric properties were obtained with an Y/Mn ratio of 1.00/0.90, which gave the smoothest and densest microstructure and the smallest leakage current.