Abstract
We demonstrate fabrication of vertically aligned, intrananowire p-n diodes by large-area epitaxial growth of Si nanowires (NWs). The axially modulated doping profile of p-n junctions is achieved by in situ doping with alternating addition of dopants in the axial sequence during Au-assisted chemical vapor deposition. We provide direct evidence of the intra-NW p-n junctions using scanning local probes in both individual NWs and vertically aligned NWs at large areas. Our study suggests implication for integrated electronics and optoelectronics based on bottom-up Si NWs. © 2009 American Institute of Physics.
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CITATION STYLE
Kim, C. J., Lee, D., Lee, H. S., Lee, G., Kim, G. S., & Jo, M. H. (2009). Vertically aligned Si intrananowire p-n diodes by large-area epitaxial growth. Applied Physics Letters, 94(17). https://doi.org/10.1063/1.3126037
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