Journal ArticleOPEN ACCESS

Scanning probe image wizard: A toolbox for automated scanning probe microscopy data analysis

Review of Scientific Instruments (2013) 84(11)
DOI: 10.1063/1.4827076
15Citations
Citations of this article
75Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure. © 2013 © 2013 Author(s).

Cite

CITATION STYLE

APA

Stirling, J., Woolley, R. A. J., & Moriarty, P. (2013). Scanning probe image wizard: A toolbox for automated scanning probe microscopy data analysis. Review of Scientific Instruments, 84(11). https://doi.org/10.1063/1.4827076

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free