Applications of terahertz time-domain reflectometry

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Abstract

A reflection-type terahertz (THz) time-domain spectroscopy (TDS) is applied to non-contact and non-destructive diagnosis of the surface and inner-structure of test samples. Raster scan imaging and THz optical coherence tomography (THz-OCT) are demonstrated for a bank bill, a high voltage cable and an indented impression on a memo-pad paper. The watermark of the bank bill, the indented impression, and a flaw in the cable are detected successfully. These results indicate that THz imaging is potentially useful for the analysis of surfaces and inner-structures of products made with various materials.

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APA

Kitahara, H., Takano, K., Ikeda, T., Tani, M., & Hangyo, M. (2007). Applications of terahertz time-domain reflectometry. IEEJ Transactions on Fundamentals and Materials, 127(7). https://doi.org/10.1541/ieejfms.127.391

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