AP-MOVPE technology and characterization of InGaAsN p-i-n subcell for InGaAsN/GaAs tandem solar cell

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Abstract

Tandem (two p-n junctions connected by tunnel junction) and multijunction solar cells (MJSCs) based on AIIIBV semiconductor compounds and alloys are the most effective photovoltaic devices. Record efficiency of the MJSCs exceeds 44% under concentrated sunlight. Individual subcells connected in series by tunnel junctions are crucial components of these devices. In this paper we present atmospheric pressure metal organic vapour phase epitaxy (AP-MOVPE) of InGaAsN based subcell for InGaAsN/GaAs tandem solar cell. The parameters of epitaxial structure (optical and electrical), fabrication process of the test solar cell devices and current-voltage (J-V) characteristics are presented and discussed. Copyright © 2011-2014 by Walter de Gruyter GmbH.

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Dawidowski, W., Ściana, B., Zborowska-Lindert, I., Mikolášek, M., Latkowska, M., Radziewicz, D., … Tlaczala, M. (2014). AP-MOVPE technology and characterization of InGaAsN p-i-n subcell for InGaAsN/GaAs tandem solar cell. International Journal of Electronics and Telecommunications, 60(2), 151–156. https://doi.org/10.2478/eletel-2014-0018

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