Journal Article

Mass Thickness Measurement in TEM: A New Single Standard Method for Convenient Quantification by TEM EDS

  • Statham P
  • Sagar J
  • Holland J
  • et al.
Microscopy and Microanalysis (2016) 22(S3) 38-39
DOI: 10.1017/s1431927616001045
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Statham, P., Sagar, J., Holland, J., Manktelow, J., & Lozano-Perez, S. (2016). Mass Thickness Measurement in TEM: A New Single Standard Method for Convenient Quantification by TEM EDS. Microscopy and Microanalysis, 22(S3), 38–39. https://doi.org/10.1017/s1431927616001045

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