Conference Proceedings

Design and test on chip for EMC

IEEE Design and Test of Computers (2006) 23(6) 502-503
DOI: 10.1109/MDT.2006.143
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Abstract

The "Design and test on chip for EMC" panel at the 2006 EMC Europe International Symposium on Electromechanical Compatibility addressed the recent explosion of the portable-electronics market and the increasingly hostile electromagnetic environment in which these systems must operate. © 2006 IEEE.

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Vargas, F. (2006). Design and test on chip for EMC. In IEEE Design and Test of Computers (Vol. 23, pp. 502–503). https://doi.org/10.1109/MDT.2006.143

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