Analysis of active resistors realized using CMOS technology

  • N P
  • B P L
  • et al.
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Abstract

The resistors implemented by IC technologies were found to be lacking in several areas of performance. The typical sheet resistance was sufficiently small that large values of resistors required large areas. The higher values of resistance attained with pinched resistors suffered nonlinearity. In addition, the tolerance of the resistors , their temperature coefficient, and their voltage coefficient were all poorer than those of capacitors. Modifications to the standard IC technology can result in better resistor implementation. However, the objective of this paper is to analyze and investigate ways of emulating a resistor without having the inherent disadvantages using standard IC technologies.

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N, P., B P, L., Anjum, N., & K A, G. (2014). Analysis of active resistors realized using CMOS technology. IOSR Journal of VLSI and Signal Processing, 4(2), 07–11. https://doi.org/10.9790/4200-04230711

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