The STM view of the initial stages of polycrystalline Ag film formation

Abstract

The growth of Ag thin films deposited at 300 K on amorphised Si surfaces under ultra high vacuum conditions is investigated by in situ scanning tunnelling microscopy. The analysis of film morphology as a function of film thickness together with additional annealing experiments allow a quite complete picture of the film formation processes to be obtained. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft.