Design and fabrication of AlN-on-Si chirped surface acoustic wave resonators for label-free cell detection

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Abstract

Chirped surface acoustic wave (SAW) resonators based on aluminum nitride (AlN) thin films have been designed and fabricated to comprehend the wave propagation characteristics induced by interdigitated transducers (IDTs) deposited on their surfaces. From the simulation results, design and geometry of the metal fingers including their width and pitch play critical roles on the wavelength of the acoustic wave and the mechanical displacement, which subsequently set the device resonant frequency. A single-step metal lift-off process involving photolithography and electron beam metal evaporation has been used to pattern and deposit Cr/Au IDT on AlN-on-Si wafers.

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Syamsu, I., Granz, T., Scholz, G., Mariana, S., Yulianto, N., Daul, L., … Wasisto, H. S. (2019). Design and fabrication of AlN-on-Si chirped surface acoustic wave resonators for label-free cell detection. In Journal of Physics: Conference Series (Vol. 1319). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/1319/1/012011

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