Abstract
The effects of slight misorientation from a (0001) singular plane on sapphire (α-Al2O3) substrates on the surface morphology and luminescence properties of MOVPE-grown GaN films have been studied. Macrostep morphology with periodic terraces (singular plane) and risers (clustered steps) has been observed for the first time on epitaxial GaN films grown on 3°-10° misoriented sapphire substrates toward both the [1010]sapphire and [1210]sapphire directions. In addition, it is found that the macrostep causes inhomogeneity of cathodoluminescence (CL) and electroluminescence (EL) patterns in Zn-doped GaN films, suggesting that the Zn-luminescence center formation depends on the growth planes of the terrace and riser. © 1991.
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CITATION STYLE
Hiramatsu, K., Amano, H., Akasaki, I., Kato, H., Koide, N., & Manabe, K. (1991). MOVPE growth of GaN on a misoriented sapphire substrate. Journal of Crystal Growth, 107(1–4), 509–512. https://doi.org/10.1016/0022-0248(91)90512-4
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