Structural study in highly compressed BiFeO 3 epitaxial thin films on YAlO 3

Abstract

We report a study on the thermodynamic stability and structure analysis of the epitaxial BiFeO 3 (BFO) thin films grown on YAlO 3 (YAO) substrate. First, we observe a phase transition of M C-M A-T occurs in thin sample (60 nm) with an utter tetragonal-like phase (denoted as M II here) with a large c/a ratio (∼1.23). Specifically, M II phase transition process refers to the structural evolution from a monoclinic M C structure at room temperature to a monoclinic M A at higher temperature (150°C) and eventually to a presence of nearly tetragonal structure above 275°C. This phase transition is further confirmed by the piezoforce microscopy measurement, which shows the rotation of polarization axis during the phase transition. A systematic study on structural evolution with thickness to elucidate the impact of strain state is performed. We note that the YAO substrate can serve as a felicitous base for growing T-like BFO because this phase stably exists in very thick film. Thick BFO films grown on YAO substrate exhibit a typical morphotropic-phase-boundary- like feature with coexisting multiple phases (M II, M I, and R) and a periodic stripe-like topography. A discrepancy of arrayed stripe morphology in different direction on YAO substrate due to the anisotropic strain suggests a possibility to tune the MPB-like region. Our study provides more insights to understand the strain mediated phase co-existence in multiferroic BFO system. © 2012 American Institute of Physics.