Abstract
Abstract The chapter begins with a short description of the superconducting quantum interference device (SQUID) sensor and the scanning SQUID technique. Next, an introduction to scanning SQUID experiments on oxide interface in chronological order. In the introduction, we briefly describe each experiment and its conclusions and try to link between the different works. In the main body of the chapter, we go into more details of the different experiments and their conclusions. We aim to describe each experiment and link between the various conclusions.
Cite
CITATION STYLE
Frenkel, Y., & Kalisky, B. (2018). Scanning SQUID measurements of oxide interfaces. In Metal Oxide-Based Thin Film Structures (pp. 225–242). Elsevier. https://doi.org/10.1016/b978-0-12-811166-6.00010-8
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