Development of microstructures of long-period stacking ordered structures in Mg85Y9Zn6 alloys annealed at 673 K (400 °c) examined by small-angle x-ray scattering

Abstract

Development of LPSO structure and in-plane ordering during annealing the Mg85Y9Zn ternary alloy sample at 673 K (400 C) was examined by synchrotron radiation small-angle scattering/diffraction measurements. By examining the first diffraction peaks for 18R, 10H, and in-plane order spot, the growth kinetics of in-plane order domain and the transition from 10H into 18R were discussed. The domain growth of in-plane order was characterized by small domain with little correlation between neighboring segregation layers. © 2013 The Minerals, Metals & Materials Society and ASM International.