Quantum jump metrology

Abstract

Quantum metrology exploits quantum correlations in specially prepared entangled or other nonclassical states to perform measurements that exceed the standard quantum limit. Typically, though, such states are hard to engineer, particularly when larger numbers of resources are desired. As an alternative, this paper aims to establish quantum jump metrology, which is based on generalized sequential measurements as a general design principle for quantum metrology and discusses how to exploit open quantum systems to obtain a quantum enhancement. By analyzing a simple toy model, we illustrate that parameter-dependent quantum feedback can indeed be used to exceed the standard quantum limit without the need for complex state preparation.