Abstract
Sulfur intercalation of a carbon rich (Formula presented.) reconstruction on silicon carbide, also known as buffer layer, is reported. In a two-zone furnace a sulfur rich precursor is heated and the gaseous species is transported for intercalation by an argon flow to the sample. Successful intercalation can be confirmed by X-ray photoelectron spectroscopy and low-energy electron diffraction. Angle-resolved photoelectron spectroscopy reveals a p-type doping of the intercalated samples. In some cases only partial intercalation appears with non-intercalated sulfur on top of the remaining buffer layer areas. Further annealing of such samples leads to a migration of the non-intercalated sulfur under the buffer layer areas, indicating that the sulfur bonded to the buffer layer constitutes a transition state.
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Wolff, S., Tilgner, N., Speck, F., Schädlich, P., Göhler, F., & Seyller, T. (2024). Quasi-Freestanding Graphene via Sulfur Intercalation: Evidence for a Transition State. Advanced Materials Interfaces, 11(2). https://doi.org/10.1002/admi.202300725
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