Impedance measurements of epitaxial and polycrystalline LSMO thin films

Abstract

The results are presented of measurements of the complex surface impedance dependence on the frequency in the 1 - 100 kHz range. La2/3Sr 1/3MnO3 (LSMO) single- and polycrystalline films were investigated at temperatures bellow the Curie temperature. The two types of layers show opposite behaviour - inductive and capacitive, correspondingly. Independently, information on the bulk resistance of the grains in the polycrystalline material and the intergrain complex resistance was obtained. © Published under licence by IOP Publishing Ltd.