Accurate surface profile measurement using CMM without estimating tip correction vectors

Abstract

Detailed measurement of the curved surface of an industrial product with a radius of curvature of less than a few millimeters is a challenging task for tactile coordinate measuring machines. To estimate a surface profile, tip radius correction is typically performed by estimating the tip correction vector direction. However, a substantial measurement error is introduced by the error in estimating the tip correction vector direction under measurement conditions such as a large position measurement error of an indicated measured point or a short sampling interval, In this study, a method that can estimate a surface profile by calculating the envelope of a probe tip path was proposed. The proposed method was experimentally and numerically confirmed to be able to estimate surface profiles with sub-micrometer accuracy under such measurement conditions.