Simultaneous atomic imaging of atomic force microscopy and scanning tunneling microscopy using metal coated cantilevers

Abstract

Imaging of surface atoms with simultaneous measurement of noncontact atomic force microscopy (NC-AFM) ánd scanning tunneling microscopy (STM) is performed. Si cantilever coated with PtIr provides stable AFM/STM operations to obtain high spatial resolution images. AFM/STM measurements on Si(111)-(7×7), Ge(111)-c(2×8), and TiO2(110) surfaces are presented at room temperature. On the Ge(111)- c(2×8) surface, adatom and restatom sites which have the same atomic patterns are determined from dual bias AFM/STM measurements. © 2009 The Japan Institute of Metals.