Testing and Delay-Monitoring for the High Reliability of Memory-Based Programmable Logic Device

Abstract

Memory-based Programmable Logic Device (MPLD) is a new type of reconfigurable device constructed using a general SRAM array in a unique interconnect configuration. This research aims to propose approaches to guarantee the long-term reliability of MPLDs, including a test method to identify interconnect defects in the SRAM array during the production phase and a delay monitoring technique to detect aging-caused failures. The proposed test method configures pre-generated test configuration data into SRAMs to create fault propagation paths, applies an external walking-zero/one vector to excite faults, and identifies faults at the external output ports. The proposed delay monitoring method configures a novel ring oscillator logic design into MPLD to measure delay variations when the device is in practical use. The logic simulation results with fault injection confirm the effectiveness of the proposed methods.