Characteristics of Bismuth trioxide film prepared by rapid thermal oxidation

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Abstract

This work presents novel results of structural, optical, and electrical properties of Bi2O3 film deposited on glass substrates by rapid thermal oxidation with aid of halogen lamp at 500°C for 45 s in static air condition without post-deposition heat treatment. The structural investigation showed that the grown bismuth trioxide film is polycrystalline and multiphase (α-Bi2O3 and β-Bi2O 3). Optical properties revealed that these films having direct optical band gap of 2.55 eV at 300 K with high transparency in the visible and NIR regions. Furthermore, these results are compared with other published results. © 2006 The Surface Science Society of Japan.

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APA

Ismail, R. A. (2006). Characteristics of Bismuth trioxide film prepared by rapid thermal oxidation. E-Journal of Surface Science and Nanotechnology, 4, 563–565. https://doi.org/10.1380/ejssnt.2006.563

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