Temperature profile and transient response of thermally tunable ridge waveguides with laterally supported suspension

Abstract

Using the thermoreflectance imaging method, the temperature profile and transient response of thermally tunable ridge waveguides with laterally supported suspension are investigated. This method has a high accuracy in the temperature measurement. The experimental data convincingly confirm a uniform temperature distribution along the waveguide except the initial 30 μm long sections near the two longitudinal edges. The 10%-90% rising time and 90%-10% falling time of the device transient thermal response are also measured to be ∼48 μs and ∼44 μs, respectively, regardless of different waveguide lengths and at different heating powers. In addition, the delay time of the waveguide transient thermal response is revealed to be 1.3 μs by comparison between experiment and simulation.