Abstract
The oxygen in-diffusion in a LPE (liquid phase epitaxy) thick film of YBCO on a MgO substrate has been investigated by the isothermal electrical resistance relaxation. The results show an in-diffusion activation energy, E, of 1.09 eV and a chemical diffusion coefficient D̃ of 10-10 - 10 -9 cm2 s-1 at 425 - 500°C. In comparison with films prepared by conventional vapor deposition, the LPE thick film shows a larger relaxation characteristic time τ and thus needs much more time to be fully oxygenated due to the crystal perfection and longer diffusion distance. © 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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CITATION STYLE
Zhang, H., Yao, X., & Zeng, X. H. (2004). Oxygen in-diffusion in LPE thick films of YBCO by electrical resistance relaxation. In Physica Status Solidi (A) Applied Research (Vol. 201, pp. 2305–2311). https://doi.org/10.1002/pssa.200306838
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