Laser-combined scanning tunnelling microscopy for probing ultrafast transient dynamics

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Abstract

The development of time-resolved scanning tunnelling microscopy (STM), in particular, attempts to combine STM with ultrafast laser technology, is reviewed with emphasis on observed physical quantities and spatiotemporal resolution. Ultrashort optical pulse technology has allowed us to observe transient phenomena in the femtosecond range, which, however, has the drawback of a relatively low spatial resolution due to the electromagnetic wavelength used. In contrast, STM and its related techniques, although the time resolution is limited by the circuit bandwidth (∼100 kHz), enable us to observe structures at the atomic level in real space. Our purpose has been to combine these two techniques to achieve a new technology that satisfies the requirements for exploring the ultrafast transient dynamics of the local quantum functions in organized small structures, which will advance the pursuit of future nanoscale scientific research in terms of the ultimate temporal and spatial resolutions. © 2010 IOP Publishing Ltd.

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Terada, Y., Yoshida, S., Takeuchi, O., & Shigekawa, H. (2010). Laser-combined scanning tunnelling microscopy for probing ultrafast transient dynamics. Journal of Physics Condensed Matter, 22(26). https://doi.org/10.1088/0953-8984/22/26/264008

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