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Configuring a 300kV cold field-emission gun for optimum analytical performance

Journal of Physics: Conference Series (2012) 371
DOI: 10.1088/1742-6596/371/1/012012
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Abstract

The performance of a new 300kV scanning transmission electron microscope (STEM) equipped with cold field-emission gun (c-FEG) is characterised with respect to the stability for and the energy width in electron energy-loss spectroscopy (EELS) and the probe size and beam current obtainable for convergent beam and scanning probe operation. These are compared to values from a 200kV FEG-(S)TEM with standard Schottky field-emission.

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APA

Ross, I. M., & Walther, T. (2012). Configuring a 300kV cold field-emission gun for optimum analytical performance. In Journal of Physics: Conference Series (Vol. 371). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/371/1/012012

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