The low energy electron diffraction (LEED) pattern of ZrO/W(100) low work function surface was analyzed using the intensity versus voltage (I-V) method. The LEED pattern was taken using a charged coupled device camera and the intensity signals were analyzed using a personal computer. The analysis suggests that the horizontal dipole atomic arrangement must be considered for obtaining a reliable I-V curve.
CITATION STYLE
Kawata, S., Nakane, H., & Adachi, H. (2001). Study on the atomic configuration for low-energy electron diffraction analysis on ZrO/W(100). Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 19(1), 55–56. https://doi.org/10.1116/1.1340671
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