Atomic-Scale Magnetometry of Dynamic Magnetization

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Abstract

The spatial resolution of imaging magnetometers has benefited from scanning probe techniques. The requirement that the sample perturbs the scanning probe through a magnetic field external to its volume limits magnetometry to samples with pre-existing magnetization. We propose a magnetometer in which the perturbation is reversed: the probe's magnetic field generates a response of the sample, which acts back on the probe and changes its energy. For an NV- spin center in diamond this perturbation changes the fine-structure splitting of the spin ground state. Sensitive measurement techniques using coherent detection schemes then permit detection of the magnetic response of paramagnetic and diamagnetic materials. This technique can measure the thickness of magnetically dead layers with better than 0.1 Å accuracy.

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Van Bree, J., & Flatté, M. E. (2017). Atomic-Scale Magnetometry of Dynamic Magnetization. Physical Review Letters, 118(8). https://doi.org/10.1103/PhysRevLett.118.087601

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