Journal ArticleOPEN ACCESS

Toward Simultaneous Assessment of In and N in InGaAsN Alloys by Quantitative STEM-ADF Imaging

  • Grillo V
  • Müller K
  • Glas F
  • et al.
Microscopy and Microanalysis (2011) 17(S2) 1862-1863
DOI: 10.1017/s143192761101018x
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Grillo, V., Müller, K., Glas, F., Volz, K., & Rosenauer, A. (2011). Toward Simultaneous Assessment of In and N in InGaAsN Alloys by Quantitative STEM-ADF Imaging. Microscopy and Microanalysis, 17(S2), 1862–1863. https://doi.org/10.1017/s143192761101018x

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