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Shi, Y., Ji, Y., Hui, F., Nafria, M., Porti, M., Bersuker, G., & Lanza, M. (2015). In Situ Demonstration of the Link Between Mechanical Strength and Resistive Switching in Resistive Random-Access Memories. Advanced Electronic Materials, 1(4). https://doi.org/10.1002/aelm.201400058
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