Structural development and energy dissipation in simulated silicon apices

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Abstract

In this paper we examine the stability of silicon tip apices by using density functional theory (DFT) calculations. We find that some tip structures - modelled as small, simple clusters - show variations in stability during manipulation dependent on their orientation with respect to the sample surface. Moreover, we observe that unstable structures can be revealed by a characteristic hysteretic behaviour present in the F(z) curves that were calculated with DFT, which corresponds to a tip-induced dissipation of hundreds of millielectronvolts resulting from reversible structural deformations. Additionally, in order to model the structural evolution of the tip apex within a low temperature NC-AFM experiment, we simulated a repeated tip-surface indentation until the tip structure converged to a stable termination and the characteristic hysteretic behaviour was no longer observed. Our calculations suggest that varying just a single rotational degree of freedom can have as measurable an impact on the tip-surface interaction as a completely different tip structure. © 2013 Jarvis et al.

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APA

Jarvis, S. P., Kantorovich, L., & Moriarty, P. (2013). Structural development and energy dissipation in simulated silicon apices. Beilstein Journal of Nanotechnology, 4(1), 941–948. https://doi.org/10.3762/bjnano.4.106

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