Scanning near-field microscopy of microdisk resonator with InP/GalnP quantum dots using cantilever-based probes

Abstract

We present cantilever-probe based scanning near-field microscopy (SNOM) studies of GaInP microdisks resonators (radii R=2 um and quality factors Q∼1000) with embedded InP quantum dots (QDs) emitting at ∼750 nm. Near-field photoluminescence spectroscopy in collection regime, using side excitation from micro-objective, was used for imaging of whispering-gallery modes (WGMs) with a spatial resolution below the light diffraction limit. Using collection-illumination regime we imaged the position of single InP/GaInP QDs in microdisk.