Abstract
Norio lwashit X-ray dill faction technique, have widely been ftpplicd for crystal structure charactcniation of carbon material , and ga c useful information. Progresses, in computer. were remarkable. which made the measurement cI diffrac-tion intensities and their correction, on di fferent [actors easier. It vf aS pointed out, therefore, that the procedures I or X-ray diffraction measurements, e to he revised so as to take into account of these progresses in computation. In the present paper, computer analysts of digital data of X-ray WI Iraction, for instance, determination of lattice constants and crystallite size of carbon materials iGakushin method I using profile fitting technique and calculation of integral intensity in the case of estimation of graphititation degree PI was reviewed. The measurement conditions to obtain a good digital diffraction data, the procedures of smoothing and intensity correction of diffraction profile were introduced. KEYWORDS: X-ray diffraction, Crystal structure. Graphitization 1. ‚Í ‚ ¶‚ß ‚É ‹ß "N,ƒR ƒ" ƒs.ƒ… •[-[ ‚Ì OEv 'ª ‹Z•p‚Ì •i •à‚É‚ae‚Á‚ÄX•ü‰ñ •Ü'• 'u‚Ì • §OEä ‚¨‚ae‚Ñ‹L˜^‚¨‚ae‚Ñ‹L˜^'• 'u ‚àƒRƒ"ƒs ƒ… •[ƒ^ ‰» ‚³ ‚ê‚Ä‚¢‚é ‚à‚Ì ‚ª ‚Ù‚AE ‚ñ ‚Ç ‚Å,‚Þ ‚µ ‚ë,X•ü•²-‰ñ •Ü ƒv ƒ•ƒt ƒ@ ƒC ƒ‹ ‚ð ƒy ƒ"‚ðŽg‚Á ‚Ä ƒ` ƒƒ •[ ƒg Ž †‚É‹L˜^‚· ‚é •û‚ª ‹H‚ȃP•[ ƒX ‚Å‚ ‚éX•ü ‰ñ •Ü'• 'u ƒ••[ ƒJ •[‚Å‚Í ‹L˜^ ‚µ‚½ƒfƒW ƒ^ƒ‹ƒf•[ƒ^ ‚ð ‚³ ‚Ü‚´‚܂Ȏè‚Ü‚´‚܂Ȏè-@ ‚ð-p ‚¢‚ĉð •Í •E•ª •Í‚· ‚é ƒRƒ"ƒsƒ… •[ ƒ^OEv ŽZ ƒvƒ•ƒO ƒ‰ ƒ€‚ð•€"õ‚µ ‚Ä‚¢‚é ‚±‚ê ‚ç‚Ì ‰ð •Í ƒvƒ• ƒOƒ‰ ƒ€‚ð‹ì Žg‚· ‚ê ‚Î,‰ñ ‹Ò Šp"x‚¨ ‚ae ‚щñ •܃s•[ ƒN ‚Ì "¼ "õŠu‚Ì OEˆ'OEˆ'è,Kƒ¿1•ü‚AEKƒ¿2•ü ‚Ì •ª •-‚È‚Ç ‚Ì ‰ð •Í,OEvŽZ •ˆ-• ‚ª ‰Â "\ ‚Å‚ ‚é•B ‚µ‚©‚µ‚È‚ª ‚ç,'Y'f •Þ"»‚É"Á-L ‚ÈOE‹ •»•\ '¢ƒpƒ‰ ƒ••[ ƒ^,-á ‚¦ ‚Î,•‚ •ƒ"xƒV ƒŠƒRƒ"•²-‚ð"à•"•W •€ ‚AE ‚·‚éŠw •U-@1)-3)‚É ‚ae‚éŠi Žq 'è •"‚¨‚ae‚ÑOE‹‚¨‚ae‚ÑOE‹ •» Žq ƒTƒC ƒY,‚Ü ‚½ ‚Í •• ‰" ‰» "x4),5)‚ð OEˆ'OEˆ'è ‚· ‚é ‚É ‚Í,‹L˜^‹L˜^ ‚³ ‚ê ‚½ ƒf ƒW ƒ^ƒ‹ƒf•[ ƒ^‚ð‰ð •Í ‚· ‚é ƒRƒ"ƒsƒ… •[ ƒ^ OEv ŽZ ƒvƒ• ƒO ƒ‰ ƒ€‚ð"AE Ž© ‚É•ì •¬‚· ‚é•K-v •«‚ª • ¶ ‚ ¶‚Ä‚-‚é •B ‚±‚±‚Å‚Í ƒRƒ"ƒsƒ… •[ ƒ^‚ð•ì ‚¢‚½ ƒfƒW ƒ^ƒ‹ƒf•[ ƒ^ ‰ð •Í‚É"K‚µ ‚½ 'ª 'è •û-@ ‚©‚ç,'Y'f.•Þ-¿ ‚É"Á-L ‚ÈOE‹ •»•\ '¢ƒpƒ‰ ƒ••[ ƒ^ ‚Ì OEˆ 'è ‚Ì •û-@ ‚ð•Ð‰î ‚· ‚é•B‹ï 'Ì "I ‚É‚Í.Šw•U-@ ‚É‚¨‚¢‚Ă͂ɂ¨‚¢‚Ä‚Í ‰ñ •܃s •[ ƒN ‚Ì ‰ñ •ÜŠp"x ‚AE "¼ 'l ••‚Ì OEˆ'OEˆ'è •û-@ ,•• ‰" ‰» "xPI‚É‚¨‚¢‚Ä‚ÍxPI‚É‚¨‚¢‚Ä‚Í •Ï •ª ‹-"x‚Ì OEv ŽZ•û-@ ‚ð‰ð •à‚· ‚é•B ‚È‚¨,‚» ‚ê ‚ç‚Ì Žè-@ ‚Ì 'ª 'è-@ ‚ɂ‚¢‚Ä‚Í,'O ‰ñ ‚Ìx•ü •²-‰ñ •܂ɂ‚¢‚Ä‚Ì ‰ð •à6)‚ȂǂðŽQ •l ‚É‚µ‚Ä‚¢‚½‚¾‚«‚½ ‚¢•B 2. ƒfƒW ƒ^ƒ‹ ƒf •[ ƒ^‚Ì 'ª 'è •ðOE• ˆË' ¶ •« ŽÀ ‚¸‚Í‚¸‚Í ‚ ¶‚ß‚É,ƒf •[ ƒ^ƒt ƒ@ ƒC ƒ‹‚Ì ‹L˜^OE`‹L˜^OE`Ž® ‚Í '• 'u ƒ••[ ƒJ•[ ‚É‚ae‚Á‚ĈقȂÁ‚Ăɂae‚Á‚ĈقȂÁ‚Ä ‚¢‚é ‚±‚AE ‚ð-• ‰ð ‚µ‚Ä‚¢‚½ ‚¾‚«‚½ ‚¢•B‹L˜^ ‚³ ‚ê ‚½ƒf•[-[ ‚Í ƒA ƒX ƒL•[OE`OE`Ž® ‚Ì ƒt ƒ@ ƒC ƒ‹‚Ƀt ƒH •[ ƒ}ƒbƒg ‚ð•ÏŠ· ‚µ‚Ä•Û' ¶ ‚Å‚«‚é ‚±‚AE ‚©-]‚Ü‚µ‚¢ ƒA ƒX ƒL •[ ƒt ƒ@ ƒC ƒ‹‚Ì ƒt ƒH •[ ƒ} ƒbƒg OE`OE`Ž®‚à'•'u ƒ••[ƒJ•[‚É‚ae ‚Á ‚ĈقȂ邪‚ĈقȂ邪,•M ŽÒ ‚Ì •ê• ‡,Šî-{"I ‚É‚ÍFig.1‚É Ž¦ ‚· ‚ae‚¤‚Ƀ} ƒCƒN ƒ•ƒ\ƒt ƒg ŽÐ ‚Ì •\ OEv ŽZƒ\ƒt Fig.
Cite
CITATION STYLE
Iwashita, N. (2003). Use of Computer Analysis for X-ray Diffraction Data. TANSO, 2003(207), 78–86. https://doi.org/10.7209/tanso.2003.78
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