Use of Computer Analysis for X-ray Diffraction Data

  • Iwashita N
N/ACitations
Citations of this article
6Readers
Mendeley users who have this article in their library.

Abstract

Norio lwashit X-ray dill faction technique, have widely been ftpplicd for crystal structure charactcniation of carbon material , and ga c useful information. Progresses, in computer. were remarkable. which made the measurement cI diffrac-tion intensities and their correction, on di fferent [actors easier. It vf aS pointed out, therefore, that the procedures I or X-ray diffraction measurements, e to he revised so as to take into account of these progresses in computation. In the present paper, computer analysts of digital data of X-ray WI Iraction, for instance, determination of lattice constants and crystallite size of carbon materials iGakushin method I using profile fitting technique and calculation of integral intensity in the case of estimation of graphititation degree PI was reviewed. The measurement conditions to obtain a good digital diffraction data, the procedures of smoothing and intensity correction of diffraction profile were introduced. KEYWORDS: X-ray diffraction, Crystal structure. Graphitization 1. ‚Í ‚ ¶‚ß ‚É ‹ß "N,ƒR ƒ" ƒs.ƒ… •[-[ ‚Ì OEv 'ª ‹Z•p‚Ì •i •à‚É‚ae‚Á‚ÄX•ü‰ñ •Ü'• 'u‚Ì • §OEä ‚¨‚ae‚Ñ‹L˜^‚¨‚ae‚Ñ‹L˜^'• 'u ‚àƒRƒ"ƒs ƒ… •[ƒ^ ‰» ‚³ ‚ê‚Ä‚¢‚é ‚à‚Ì ‚ª ‚Ù‚AE ‚ñ ‚Ç ‚Å,‚Þ ‚µ ‚ë,X•ü•²-‰ñ •Ü ƒv ƒ•ƒt ƒ@ ƒC ƒ‹ ‚ð ƒy ƒ"‚ðŽg‚Á ‚Ä ƒ` ƒƒ •[ ƒg Ž †‚É‹L˜^‚· ‚é •û‚ª ‹H‚ȃP•[ ƒX ‚Å‚ ‚éX•ü ‰ñ •Ü'• 'u ƒ••[ ƒJ •[‚Å‚Í ‹L˜^ ‚µ‚½ƒfƒW ƒ^ƒ‹ƒf•[ƒ^ ‚ð ‚³ ‚Ü‚´‚܂Ȏè‚Ü‚´‚܂Ȏè-@ ‚ð-p ‚¢‚ĉð •Í •E•ª •Í‚· ‚é ƒRƒ"ƒsƒ… •[ ƒ^OEv ŽZ ƒvƒ•ƒO ƒ‰ ƒ€‚ð•€"õ‚µ ‚Ä‚¢‚é ‚±‚ê ‚ç‚Ì ‰ð •Í ƒvƒ• ƒOƒ‰ ƒ€‚ð‹ì Žg‚· ‚ê ‚Î,‰ñ ‹Ò Šp"x‚¨ ‚ae ‚щñ •܃s•[ ƒN ‚Ì "¼ "õŠu‚Ì OEˆ'OEˆ'è,Kƒ¿1•ü‚AEKƒ¿2•ü ‚Ì •ª •-‚È‚Ç ‚Ì ‰ð •Í,OEvŽZ •ˆ-• ‚ª ‰Â "\ ‚Å‚ ‚é•B ‚µ‚©‚µ‚È‚ª ‚ç,'Y'f •Þ"»‚É"Á-L ‚ÈOE‹ •»•\ '¢ƒpƒ‰ ƒ••[ ƒ^,-á ‚¦ ‚Î,•‚ •ƒ"xƒV ƒŠƒRƒ"•²-‚ð"à•"•W •€ ‚AE ‚·‚éŠw •U-@1)-3)‚É ‚ae‚éŠi Žq 'è •"‚¨‚ae‚ÑOE‹‚¨‚ae‚ÑOE‹ •» Žq ƒTƒC ƒY,‚Ü ‚½ ‚Í •• ‰" ‰» "x4),5)‚ð OEˆ'OEˆ'è ‚· ‚é ‚É ‚Í,‹L˜^‹L˜^ ‚³ ‚ê ‚½ ƒf ƒW ƒ^ƒ‹ƒf•[ ƒ^‚ð‰ð •Í ‚· ‚é ƒRƒ"ƒsƒ… •[ ƒ^ OEv ŽZ ƒvƒ• ƒO ƒ‰ ƒ€‚ð"AE Ž© ‚É•ì •¬‚· ‚é•K-v •«‚ª • ¶ ‚ ¶‚Ä‚-‚é •B ‚±‚±‚Å‚Í ƒRƒ"ƒsƒ… •[ ƒ^‚ð•ì ‚¢‚½ ƒfƒW ƒ^ƒ‹ƒf•[ ƒ^ ‰ð •Í‚É"K‚µ ‚½ 'ª 'è •û-@ ‚©‚ç,'Y'f.•Þ-¿ ‚É"Á-L ‚ÈOE‹ •»•\ '¢ƒpƒ‰ ƒ••[ ƒ^ ‚Ì OEˆ 'è ‚Ì •û-@ ‚ð•Ð‰î ‚· ‚é•B‹ï 'Ì "I ‚É‚Í.Šw•U-@ ‚É‚¨‚¢‚Ă͂ɂ¨‚¢‚Ä‚Í ‰ñ •܃s •[ ƒN ‚Ì ‰ñ •ÜŠp"x ‚AE "¼ 'l ••‚Ì OEˆ'OEˆ'è •û-@ ,•• ‰" ‰» "xPI‚É‚¨‚¢‚Ä‚ÍxPI‚É‚¨‚¢‚Ä‚Í •Ï •ª ‹-"x‚Ì OEv ŽZ•û-@ ‚ð‰ð •à‚· ‚é•B ‚È‚¨,‚» ‚ê ‚ç‚Ì Žè-@ ‚Ì 'ª 'è-@ ‚ɂ‚¢‚Ä‚Í,'O ‰ñ ‚Ìx•ü •²-‰ñ •܂ɂ‚¢‚Ä‚Ì ‰ð •à6)‚ȂǂðŽQ •l ‚É‚µ‚Ä‚¢‚½‚¾‚«‚½ ‚¢•B 2. ƒfƒW ƒ^ƒ‹ ƒf •[ ƒ^‚Ì 'ª 'è •ðOE• ˆË' ¶ •« ŽÀ ‚¸‚Í‚¸‚Í ‚ ¶‚ß‚É,ƒf •[ ƒ^ƒt ƒ@ ƒC ƒ‹‚Ì ‹L˜^OE`‹L˜^OE`Ž® ‚Í '• 'u ƒ••[ ƒJ•[ ‚É‚ae‚Á‚ĈقȂÁ‚Ăɂae‚Á‚ĈقȂÁ‚Ä ‚¢‚é ‚±‚AE ‚ð-• ‰ð ‚µ‚Ä‚¢‚½ ‚¾‚«‚½ ‚¢•B‹L˜^ ‚³ ‚ê ‚½ƒf•[-[ ‚Í ƒA ƒX ƒL•[OE`OE`Ž® ‚Ì ƒt ƒ@ ƒC ƒ‹‚Ƀt ƒH •[ ƒ}ƒbƒg ‚ð•ÏŠ· ‚µ‚Ä•Û' ¶ ‚Å‚«‚é ‚±‚AE ‚©-]‚Ü‚µ‚¢ ƒA ƒX ƒL •[ ƒt ƒ@ ƒC ƒ‹‚Ì ƒt ƒH •[ ƒ} ƒbƒg OE`OE`Ž®‚à'•'u ƒ••[ƒJ•[‚É‚ae ‚Á ‚ĈقȂ邪‚ĈقȂ邪,•M ŽÒ ‚Ì •ê• ‡,Šî-{"I ‚É‚ÍFig.1‚É Ž¦ ‚· ‚ae‚¤‚Ƀ} ƒCƒN ƒ•ƒ\ƒt ƒg ŽÐ ‚Ì •\ OEv ŽZƒ\ƒt Fig.

Cite

CITATION STYLE

APA

Iwashita, N. (2003). Use of Computer Analysis for X-ray Diffraction Data. TANSO, 2003(207), 78–86. https://doi.org/10.7209/tanso.2003.78

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free