Terahertz frequency Hall measurement by magneto-optical Kerr spectroscopy in InAs

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Abstract

We report on the time-domain terahertz (THz) magneto-optical Kerr spectroscopy in the frequency range from 0.5 to 2.5 THz. The developed technique employs reflection geometry, enabling high-frequency noncontact Hall measurements in opaque samples. We also present a method to reveal the off-diagonal component of the complex dielectric tensor from the measured polarization-dependent THz wave forms. At a static magnetic field of 0.48 T, a large Kerr rotation over 10° originating from magnetoplasma resonance is observed in an n-type undoped InAs wafer at room temperature. This indicates the strong potential of this material for the polarization modulator in the THz regime. © 2002 American Institute of Physics.

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Shimano, R., Ino, Y., Svirko, Y. P., & Kuwata-Gonokami, M. (2002). Terahertz frequency Hall measurement by magneto-optical Kerr spectroscopy in InAs. Applied Physics Letters, 81(2), 199–201. https://doi.org/10.1063/1.1492319

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