Silicon in Fe‐Si Alloys: Correction of X‐Ray Intensities for Preferred Orientation

Abstract

A texture effect in the silicon phase of industrial Fe‐Si alloys was noticed in the X‐ray diffraction patterns through the reinforcement of the 111 reflection. A similar effect was also apparent in a commercial silicon standard pellet used as reference material and supposed to be texture‐free.A quick correction procedure to account for preferred orientation effects was developed, based on a previous algorithm currently applied for the automatic profile fitting of powder diffractometer data. “Modified Wilson plots” are established for visualizing the efficiency of texture correction according to the proposed method.