Designing of bayesian skip lot sampling plan under destructive testing

Abstract

Skip-lot sampling plan serves as a cost-effective technique to manage the cost of performing frequent product inspections. As a powerful tool within a real-time quality management system, the ability to collect data which an optimize skip-lot sampling parameters affords manufacturers the luxury of lowering inspection expenses in various manufacturing units. The good quality of product can be produced in continuous improvement of production process in excellent quality history for suppliers. The procedures and necessary tables are provided for finding the respective plans for which sum of producer and consumer risks are minimized with acceptable and limiting quality levels which accounts for the prior distribution of process state for each lot and revenue received appreciably which reduces destructive testing.