Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2

3Citations
Citations of this article
10Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

Bulk electronic structure of novel layered superconductor Nd(O,F)BiS2 was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS2 and La(O,F)BiS2, we discuss possible important factors for the superconductivity in this series of material.

Cite

CITATION STYLE

APA

Terashima, K., Sonoyama, J., Sunagawa, M., Fujiwara, H., Nagayama, T., Muro, T., … Yokoya, T. (2016). Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2. In Journal of Physics: Conference Series (Vol. 683). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/683/1/012003

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free