Towards a traceable enhancement factor in surface-enhanced Raman spectroscopy

Abstract

The enhancement factor (EF) is an essential parameter in the field of surface-enhanced Raman spectroscopy (SERS), indicating the magnification of the Raman signal of molecules interacting with the surface of plasmonic nanostructures. The calculation of EF requires a careful evaluation of both the signal intensities and the number of molecules in SERS and normal Raman conditions. The determination of the surface density of molecules adsorbed on the plasmonic substrate is a challenging task, but essential for the estimation of the number of SERS-active molecules. This paper describes the determination of EF using 7-mercapto-4-methylcoumarin (MMC) as the probe molecule on gold-coated silicon nanowires, integrating SERS and normal Raman spectroscopy with X-ray fluorescence (RF-XRF) data that provide a reference-free quantitative measurement of the molecular surface density. In addition, the surface coverage of MMC on the substrate is modelled by molecular mechanics (MM) and molecular dynamics (MD) simulations.