Abstract
Optical elements to be used for x-ray free electron lasers (XFELs) must withstand multiple high-fluence pulses. We have used an ultraviolet laser to study the damage of two candidate materials, crystalline Si and B4 C -coated Si, emulating the temperature profile expected to occur in optics exposed to XFEL pulses. We found that the damage threshold for 105 pulses is ∼20% to 70% lower than the melting threshold. © 2008 American Institute of Physics.
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CITATION STYLE
Hau-Riege, S. P., London, R. A., Bionta, R. M., Soufli, R., Ryutov, D., Shirk, M., … Nataraj, P. (2008). Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser. Applied Physics Letters, 93(20). https://doi.org/10.1063/1.3021081
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