Research on Image Defect Detection of Silicon Panel Based on Prewitt and Canny Operator

Abstract

The silicon panel is the core component of photovoltaic power generation, whose surface quality is related to its service life and power generation efficiency. However, microcracks, fragments, incomplete welding, broken grids, and other defects often occur in industrial production. The edge detection algorithm is usually used to detect defects in silicon panels, but the common edge detection algorithm has an impact on defect detection because of the grid shadow of the panel. The current mainstream defect detection algorithm based on convolutional neural network requires a large number of positive and negative samples of image data sets for pretraining the model, which consumes a lot of time and GPU computing power, and the steps are cumbersome. To solve the problem, a defect detection method based on Prewitt and Canny operators is proposed in this article. In this method, Prewitt and Canny operators are combined to eliminate the effect of grids on the detection. The microcrack defects and their specific positions can be detected efficiently and intuitively, therefore improving the detection accuracy. The experimental results indicate that the purity and integrity of the defect profile of the image processed by the algorithm are greatly improved. The foreground edge is clear, and the defect recognition accuracy is higher, which effectively prevent the impact of grid shadow on weld testing.