Journal ArticleOPEN ACCESS

High-throughput XPS spectrum modeling with autonomous background subtraction for 3 d 5/2 peak mapping of SnS

  • Matsumura T
  • Nagamura N
  • Akaho S
  • et al.
Science and Technology of Advanced Materials: Methods (2023) 3(1)
DOI: 10.1080/27660400.2022.2159753
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Abstract

1. Peak fitting is one of the important approaches in spectroscopy for investigating physical and chemical properties of materials and devices [1–4]. In order to perform high-accurate peak fitting,...

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Matsumura, T., Nagamura, N., Akaho, S., Nagata, K., & Ando, Y. (2023). High-throughput XPS spectrum modeling with autonomous background subtraction for 3 d 5/2 peak mapping of SnS. Science and Technology of Advanced Materials: Methods, 3(1). https://doi.org/10.1080/27660400.2022.2159753

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