Comparison of resonant inelastic x-ray scattering spectra and dielectric loss functions in copper oxides

Abstract

We report empirical comparisons of CuK -edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin-zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi2 CuO4, CuGeO3, Sr2 Cu3 O4 Cl2, La2 CuO4, and Sr2 CuO2 Cl2, and analyzed by considering both incident and scattered-photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi2 CuO4 and CuGeO3. © 2009 The American Physical Society.